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题名: Implementation of Certified 150–Ω Voltage Probe for IEC 61967–4 Conducted Electromagnetic Emission Measurement
作者: Yin-Cheng Chang;Ta-Yeh Lin;Ping-Yi Wang;Shawn S. H. Hsu;Mao-Hsu Yen;Chun-Yi Hung;Da-Chiang Chang
贡献者: 國立臺灣海洋大學:資訊工程學系
关键词: Probes;IEC Standards;Integrated circuits;Impedance;Semiconductor device measurement;Electromagnetic interference;Voltage measurement
日期: 2018-10
上传时间: 2019-12-25T08:51:33Z
出版者: IEEE
摘要: A 150-Ω probe which fully complied with the IEC standard 61967-4 is proposed for the conducted emission testing at IC level. The 150-Ω direct coupling method is reviewed, and the concern of precise measurement and the property of easy to use is discussed. The 150-Ω network is implemented by the integrated passive device (IPD) process instead of surface-mount devices (SMDs). With the reduced parasitic effect, the proposed 150-Ω probe is verified to fulfill the specifications of IEC standard which make the characterization of EMI at IC level guarantee the high precision and high repeatability.
显示于类别:[資訊工程學系] 演講及研討會


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