English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28611/40649
Visitors : 634946      Online Users : 60
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/52723

Title: Implementation of Certified 150–Ω Voltage Probe for IEC 61967–4 Conducted Electromagnetic Emission Measurement
Authors: Yin-Cheng Chang;Ta-Yeh Lin;Ping-Yi Wang;Shawn S. H. Hsu;Mao-Hsu Yen;Chun-Yi Hung;Da-Chiang Chang
Contributors: 國立臺灣海洋大學:資訊工程學系
Keywords: Probes;IEC Standards;Integrated circuits;Impedance;Semiconductor device measurement;Electromagnetic interference;Voltage measurement
Date: 2018-10
Issue Date: 2019-12-25T08:51:33Z
Publisher: IEEE
Abstract: A 150-Ω probe which fully complied with the IEC standard 61967-4 is proposed for the conducted emission testing at IC level. The 150-Ω direct coupling method is reviewed, and the concern of precise measurement and the property of easy to use is discussed. The 150-Ω network is implemented by the integrated passive device (IPD) process instead of surface-mount devices (SMDs). With the reduced parasitic effect, the proposed 150-Ω probe is verified to fulfill the specifications of IEC standard which make the characterization of EMI at IC level guarantee the high precision and high repeatability.
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/52723
Appears in Collections:[資訊工程學系] 演講及研討會

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback