National Taiwan Ocean University Institutional Repository:Item 987654321/52722
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 28611/40652
造访人次 : 782514      在线人数 : 77
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 进阶搜寻

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/52722

题名: EMS Characterization of LDO with On-chip Decaps by Using Direct RF Power Injection Method
作者: Yin-Cheng Chang;Ping-Yi Wang;Hsu-Feng Hsiao;Ta-Yeh Lin;Shawn S.H. Hsu;Mao-Hsu Yen;Ming-Shan Lin;Da-Chiang Chang
贡献者: 國立臺灣海洋大學:資訊工程學系
关键词: Energy management;Integrated circuits;Radio frequency;Immunity testing;Capacitors;Wideband
日期: 2018-11
上传时间: 2019-12-25T07:58:44Z
出版者: IEEE
摘要: A fully integrated low dropout regulator (LDO) with decoupling capacitors (decaps) for high electromagnetic immunity is designed in the standard 0.18 μm CMOS technology. The decaps composed of MOS and MoM capacitors are utilized to decouple the high frequency interference. The characteristic of electromagnetic susceptibility (EMS) of the LDO is performed by the direct RF power injection (DPI) measurement up to 18 GHz. The measured results demonstrate the immunity of LDO with decaps is superior to that of LDO without decaps (maximum improvement of 11.6 dB). Also, the wideband DPI measurement is shown to be capable of characterizing the EMS of ICs.
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/52722
显示于类别:[資訊工程學系] 演講及研討會

文件中的档案:

档案 描述 大小格式浏览次数
index.html0KbHTML28检视/开启


在NTOUR中所有的数据项都受到原著作权保护.

 


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈