English  |  正體中文  |  简体中文  |  Items with full text/Total items : 27308/39152
Visitors : 2448590      Online Users : 130
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51728

Title: Resonant-tunneling-diode effect in Si-based double-barrier structure sputtered at room temperature
Authors: Yuang-Tung Cheng
Jyh-Jier Ho
T. Wei
J. Ho
Sheng-Shih Wang
J. Lin
C. Yeh
Kang L Wang
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: Resonant-tunneling-diode (RTD)
Structural
Thin films
Peak-to-valley current ratio (PVCR)
Semiconductor
Date: 2015-06
Issue Date: 2018-12-21T06:14:52Z
Publisher: International Journal of Research in Engineering and Science
Abstract: Abstract: This paper presents the resonant-tunneling-diode (RTD) effect in a SiO2/n-Si/SiO2/p-Si
double-barrier structural thin films fabricated using radio frequency (RF) magnetron sputtering at room
temperature (300 K). The implementation of a circuit prototype is first accomplished by modulating a Si-based
RTD with a solar-cell bias voltage. The important electrical properties of the peak current density and
peak-to-valley current ratio (PVCR) are 184 nA/cm2
and 1.67, respectively. The connection between the two
RTDs in series is biased by a solar cell. The value of the switching transition time is 24.37 μs; oscillation occurs
with an operating frequency of 41.6 KHz. In semiconductor applications, the developed RTD is characterized by
stability, enduring environmentally elevated temperature and relative humidity.
Relation: 3(6) pp.25-28
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51728
Appears in Collections:[電機工程學系] 期刊論文

Files in This Item:

File Description SizeFormat
index.html0KbHTML19View/Open


All items in NTOUR are protected by copyright, with all rights reserved.

 


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback