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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51664

Title: Emission of Rough Surfaces Calculated by the Integral Equation Method With Comparison to Three-Dimensional Moment Method Simulations
Authors: K. S. Chen
T. D. Wu
Leung Tsang
Qin Li
Jiancheng Shi
A. K. Fung
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: Rough surfaces
Surface roughness
Integral equations
Moment methods
Scanning probe microscopy
Microwave theory and techniques
Remote sensing
Fresnel reflection
Date: 2003-02-28
Issue Date: 2018-12-14T06:51:42Z
Publisher: IEEE Transactions on Geoscience and Remote Sensing
Abstract: Abstract: This paper presents a model of microwave emissions from rough surfaces. We derive a more complete expression of the single-scattering terms in the integral equation method (IEM) surface scattering model. The complementary components for the scattered fields are rederived, based on the removal of a simplifying assumption in the spectral representation of Green's function. In addition, new but compact expressions for the complementary field coefficients can be obtained after quite lengthy mathematical manipulations. Three-dimensional Monte Carlo simulations of surface emission from Gaussian rough surfaces were used to examine the validity of the model. The results based on the new version (advanced IEM) indicate that significant improvements for emissivity prediction may be obtained for a wide range of roughness scales, in particular in the intermediate roughness regions. It is also shown that the original IEM produces larger errors that lead to tens of Kelvins in brightness temperature, which are unacceptable for passive remote sensing.
Relation: 414(1) pp.90-101
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51664
Appears in Collections:[電機工程學系] 期刊論文

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