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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51663

Title: A Re- examination of the IEM Model for Microwave Scattering from Randomly Rough Boundary
Authors: W. Y. Liu
K. S. Chen
M. K. Tsay
T. D. Wu
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: microwave scattering
multiple scattering
rough boundary
Date: 2011-03-03
Issue Date: 2018-12-14T06:47:18Z
Publisher: Journal of the Chinese Institute of Engineers
Abstract: Abstract: An IEM surface scattering model was examined in terms of its applicability to simulations and laboratory measurements. New expressions for both single scattering and multiple scattering were obtained by re‐deriving the scattering coefficient to keep all the phase terms in the spectral representation of Green's function. After quite intricate mathematical manipulations, a fairly compact form for an advanced IEM model (AIEM) is obtained for the scattering coefficients. In addition, the Fresnel reflection coefficients used in the model were replaced by a transition function. The comparisons in this paper were concentrated in the case of backscattering with both numerical simulations and measurement data. The results indicate that the IEM is improved, becoming more accurate and practical to use.
Relation: 26(3) pp.271-277
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51663
Appears in Collections:[電機工程學系] 期刊論文

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