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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51662

Title: A Reappraisal of the Validity of the IEM Model for Backscattering from Rough Surfaces
Authors: T. D. Wu
K. S. Chen
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: Backscatter
Rough surfaces
Surface roughness
Numerical simulation
Integral equations
Green's function methods
Fresnel reflection
Date: 2004-04-19
Issue Date: 2018-12-14T06:43:29Z
Publisher: IEEE Transactions on Geoscience and Remote Sensing
Abstract: Abstract: An integral equation method (IEM) surface scattering model was examined in terms of its applicability to laboratory measurement and numerical simulations. New expressions for both single scattering and multiple scattering were obtained by rederiving the scattering coefficient to keep all the phase terms in the spectral representation of the Green's function. After quite intricate mathematical manipulations, a fairly compact form is obtained for the scattering coefficients. In addition, the Fresnel reflection coefficients used in the model were replaced by a transition function that takes surface roughness and permittivity into account. The results of comparisons with both the numerical simulations and measurements for the backscattering case indicate that the IEM is improved, becoming more accurate and practical to use.
Relation: 42(4) pp.743-753
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51662
Appears in Collections:[電機工程學系] 期刊論文

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