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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51661

Title: X-ray diffraction and Raman scattering study of thermal-induced phase transformation in vertically-aligned TiO2 nanocrystals grown on sapphire(100) via metal organic vapor deposition
Authors: C.A. Chen
K.Y. Chen
Y.S. Huang
D.S. Tsai
K.K. Tiong
F.Z. Chien
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: A1. X-ray diffraction
A1. Nanostructures
A1. Raman scattering
A3. Metal organic chemical vapor deposition
B1. Nanomaterials
B1. Oxides
Date: 2008-07-15
Issue Date: 2018-12-14T06:36:18Z
Publisher: Journal of Crystal Growth
Abstract: Abstract: We report a detailed study of thermal-induced phase transformation in TiO2 nanocrystals (NCs) via X-ray diffraction (XRD) and Raman scattering (RS) spectroscopy. Vertically aligned anatase TiO2(1 1 0) NCs were grown on the sapphire (SA)(1 0 0) substrate at 550 °C by metal organic chemical vapor deposition, using titanium-tetraisopropoxide (TTIP, Ti[OCH(CH3)2]4), as the source reagent. The effects of thermal annealing of TiO2 NCs in oxygen atmosphere between 600 and 1000 °C were investigated. XRD and RS spectra showed the onset of the phase transformation process from the as-grown anatase TiO2(1 1 0) NCs into rutile TiO2(0 0 1) at the annealing temperature of 800 °C. At annealing temperature higher than 900 °C, pure rutile phase of TiO2(0 0 1) NCs were formed and the crystalline quality of TiO2 NCs could be further improved upon higher annealing temperature.
Relation: 310(15) pp.3663-3667
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51661
Appears in Collections:[電機工程學系] 期刊論文

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