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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51636

Title: Optical characterization of bulk Zn1-xBexTe crystals
Authors: Y C Shih
Y S Huang
F Firszt
S Łegowski
H Meczynska
K K Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Date: 2008
Issue Date: 2018-12-13T03:55:55Z
Publisher: Journal of Physics Condensed Matter
Abstract: Abstract: This paper presents an optical characterization of three bulk sphalerite Zn1−xBexTe crystals grown by the modified high pressure Bridgman method. The study was conducted in the near-band-edge interband transition regime using low temperature photoluminescence (PL), temperature-dependent contactless electroreflectance (CER) and/or photoreflectance (PR) in the temperature range of 15–400 K, and surface photovoltage spectroscopy (SPS) at room temperature. PL spectra at low temperatures of the samples investigated consist of an excitonic line, a band due to recombination of free electrons with holes located at shallow acceptors and a broad band related to recombination through deeper level defects. The band-edge excitonic transitions have been observed in the CER/PR spectra. The fundamental transition energies E0 are determined via lineshape fits to the CER/PR spectra. The values of E0 at room temperature obtained from CER/PR spectra correspond well to that determined from SPS measurements, and the Be contents x of the samples are determined using a linear equation which describes the room temperature band gap dependence on composition for the Zn1−xBexTe alloy system. The parameters describing the temperature dependence of the band-edge excitonic transition energies are evaluated and discussed.
Relation: 20(25)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51636
Appears in Collections:[電機工程學系] 期刊論文

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