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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51604

Title: Growth and structural characterization of well aligned RuO2 nanocrystals on LiNbO3 (100) via MOCVD
Authors: P.C. Liao
C.A. Chen
J.G. Chi
Y.S. Huang
D.S. Tsai
K.K. Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: Oxide materials
Metal–organic chemical vapor deposition
Scanning electron microscopy
X-ray diffraction
Date: 2009-07
Issue Date: 2018-12-07T08:44:11Z
Publisher: Journal of Alloys and Compounds
Abstract: Abstract: We report the preparation of well-aligned RuO2 nanorods (NRs) on LiNbO3(1 0 0) by metal–organic chemical vapor deposition using bis(ethylcyclopentadienyl) ruthenium (II) as the source reagent. The surface morphology and structural properties of the as-grown NRs were characterized by using field emission scanning electron microscopy and X-ray diffractometry. The growth pattern initiated with nucleation of both (0 0 1) and (3 0 1) planes at the substrate surface, but eventually NRs with (0 0 1) growth plane outgrew and formed vertically aligned NRs on top of the mixed alignments at the interface. The observed epitaxial growth patterns are explained in terms of the relationship between the atomic arrangements of the substrate and the NRs and the c-directional growth mechanism.
Relation: 480(1) pp.100-103
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51604
Appears in Collections:[電機工程學系] 期刊論文

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