English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28611/40649
Visitors : 621532      Online Users : 68
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51603

Title: Evidence of type-II band alignment at the ordered GaInNP to GaAs heterointerface
Authors: H. P. Hsu
Y. N. Huang
Y. S. Huang
P. Sitarek
K. K. Tiong
C. W. Tu
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: 78.20.Ci
Date: 2009-05-05
Issue Date: 2018-12-07T08:41:15Z
Abstract: Abstract: Polarized piezoreflectance (PzR) and photoreflectance (PR) are employed to study band alignment in Ga0.46In0.54Ny P1–y /GaAs heterostructures grown by gas‐source molecular‐beam epitaxy. The features near the band edge of Ga0.46In0.54Ny P1–y show strong polarization dependence, indicating the existence of some degree of ordering of these samples. The PR spectra exhibit Franz–Keldysh Oscillations (FKOs) above the band edge of GaAs. The electric fields in the GaAs region are evaluated by analyzing the FKOs and found to decrease with increasing nitrogen content. The type‐II band alignment at the Ga0.46In0.54Ny P1–y /GaAs interface is concluded for the alloys with nitrogen content y larger than 0.5% based on the appearance of additional features below band edge of GaAs. These features are attributed to the spatially indirect type‐II transitions in the vicinity of interface region between Ga0.46In0.54Ny P1–y and GaAs. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim).
Relation: 206(5) pp.803-807
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51603
Appears in Collections:[電機工程學系] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback