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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51591

Title: Photoluminescence and Photoreflectance Characterization of ZnxCd1-xSeMgSe Multiple Quantum Wells
Authors: J. D. Wu
Y. S. Huang
B. S. Li
A. Shen
M. C. Tamargo
K. K. Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Date: 2010-12
Issue Date: 2018-12-07T07:30:47Z
Publisher: JOURNAL OF APPLIED PHYSICS
Abstract: ABSTRACT: Photoluminescence (PL) and photoreflectance (PR) were used to characterize ZnxCd1−xSe/MgSe multiple quantum well (MQW) structures grown on InP substrates by molecular beam epitaxy for mid-infrared (IR) device applications. The PL spectra yielded information of the fundamental excitonic recombination and ZnxCd1−xSe cap/spacer band edge emission of the samples. The PR spectra revealed multitude of possible interband transitions in MQW structures. The ground state transitions were assigned by comparing with the PL emission signals taken from the same structures. A comprehensive analysis of the PR spectra led to the identification of various interband transitions. The intersubband transitions were then estimated and found to be in a good agreement with the previous report of Fourier-transform IR absorption measurements [Li et al., Appl. Phys. Lett. 92, 261104 (2008)]. The results demonstrate the potential of using PL and PR as nondestructive optical techniques for characterization of ZnxCd1−xSe/MgSe MQWs for mid-IR device applications.
Relation: 108(12)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51592
Appears in Collections:[電機工程學系] 期刊論文

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