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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51585

Title: Characterization of Zn0.95-xBexMn0.05Se mixed crystals by photoluminescence and contactless electroreflectance
Authors: Dumitru Dumcenco
Chen-Tai Huang
Ying-Sheng Huang
Franciszek Firszt
Stanislaw Łęgowski
Hanna Męczyńska
Jacek Zakrzewski
Kwong-Kau Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: ZnBeMnSe
growth from melts
excitons
photoluminescence
reflectivity
Date: 2010-05
Issue Date: 2018-12-07T07:04:22Z
Publisher: physica status solidi (c) - Wiley Online Library
Abstract: Abstract: Temperature‐dependent photoluminescence (PL) and contactless electroreflectance (CER) measurements of Zn0.95‐xBexMn0.05Se mixed crystals with different Be content (0 ≤ x ≤ 0.26) grown by the modified high pressure Bridgman method has been carried out in the temperature range 15–300 K. The peak positions of band‐edge exciton features in the PL spectra are slightly shifted towards lower energies as compared to the corresponding transition energies obtained from CER data. The observed increases of the CER‐PL shift with the increasing of Be content are explained by the increasing compositional disorder causing the smearing of the band‐edge energies. The excitonic line broadening for the samples with larger Be/Zn ratio are attributed in part to the alloy scattering effects and also to the poorer crystalline quality of the samples with higher content of Be. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Relation: 7(6) pp.1460-1462
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51585
Appears in Collections:[電機工程學系] 期刊論文

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