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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51575

Title: Growth and characterization of well-aligned RuO2/R-TiO2 heteronanostructures on sapphire (100) substrates by reactive magnetron sputtering
Authors: Hung-Pin Hsu
Ying-Sheng Huang
Chien-Nan Yeh
Yi-Min Chen
Dah-Shyang Tsai
Kwong-Kau Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: RuO2
TiO2
X-Ray Diffraction (XRD)
Field Emission Scanning Electron Microscopy (FESEM)
Date: 2011-04
Issue Date: 2018-12-07T06:31:17Z
Publisher: Solid State Phenomena
Abstract: Abstract: We report the growth of well-aligned RuO2/R-TiO2 heteronanostructures on sapphire (100) substrates by reactive magnetron sputtering using Ti and Ru metal targets under different conditions. The surface morphology and structural properties of the as-deposited heteronanostructures were characterized using field-emission scanning electron microscopy (FESEM), X-ray diffraction (XRD), transmission electron microscopy (TEM) and selected-area electron diffractometry (SAED). The FESEM micrographs and XRD patterns indicated the growth of vertically aligned RuO2(001) nanotubes and twinned V-shaped RuO2(101) nanowedges (NWs) on top of R-TiO2 nanorods under different sputtering pressures. TEM and SAED characterizations of the V-shaped RuO2 NWs showed that the NWs are crystalline RuO2 with twin planes of (101) and twin direction of [ 01] at the V-junction.
Relation: 170 pp.78-82
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51575
Appears in Collections:[電機工程學系] 期刊論文

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