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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51565

Title: Deposition and structural characterization of nanostructured RuO2 on rutile-TiO2/sapphire(100) templates by reactive radio frequency magnetron sputtering
Authors: Y.M. Chen
C.N. Yeh
C.A. Chen
Y.S. Huang
H.P. Hsu
D.S. Tsai
K.K. Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Date: 2012-01
Issue Date: 2018-12-07T05:44:38Z
Publisher: Thin Solid Films
Abstract: Abstract: We report the deposition and structural characterization of nanostructural RuO2 on rutile (R)-TiO2/sapphire(100) templates by reactive radio frequency magnetron sputtering. The micrographs of field-emission scanning electron microscopy and X-ray diffraction patterns of RuO2/R-TiO2 heteronanostructures indicated the growth of vertically aligned RuO2 (001) nanotubes (NTs) and/or V-shaped RuO2(101) nanowedges (NWs) on top of R-TiO2 nanorods (NRs). Transmission electron microscopy and selected-area electron diffractometry characterizations of the vertically aligned RuO2 NTs showed that the hollow RuO2 NTs with square cross section have open-end morphology with long axis directed along the [0 0 1] direction, while the V-shaped RuO2 NWs revealed that the nanowedges are crystalline RuO2 with twin plane of (101) and twin direction of 1¯01 at the V-junction. The probable mechanisms for the formation of well-aligned RuO2 nanocrystals on top of R-TiO2 NRs were discussed.
Relation: 520(7) pp.2810–2813
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/51565
Appears in Collections:[電機工程學系] 期刊論文

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