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Title: Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector
Authors: Ying-Shin Huang
Sheng-Yao Hu
Yueh-Chien Lee
Chung-Cheng Chang
Kwong-Kau Tiong
Ji-Lin Shen
Wu-Ching Chou
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: ZnTe
Distributed Bragg reflectors
Molecular beam epitaxy
Date: 2015
Issue Date: 2018-12-06T07:29:39Z
Publisher: J. Alloy.Comp
Abstract: Abstract: We report the characteristics of reflectance spectra of the 15- and 20-period ZnTe/ZnSe distributed Bragg reflector grown on GaAs (001) substrates by molecular beam epitaxy. The reflectance spectra measured at various incident angles and polarizations were investigated by the theoretical curves simulated using transfer matrix method. The wavelength variation of the refractive indices described by Sellmeier equation and random thickness model were also considered for the interpretation of the experimentally observed curves. An omnidirectional reflection range defined from the edge of incident-angle-dependent reflection band with TE and TM polarizations is about 15 nm, and is consistent with the observed experimental curves. The results showed that the selected ZnTe and ZnSe materials are suitable for constructing multilayer structures having omnidirectional reflection band.
Relation: 649 pp.755-759
Appears in Collections:[Department of Electrical Engineering] Periodical Articles

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