English  |  正體中文  |  简体中文  |  Items with full text/Total items : 26987/38787
Visitors : 2281379      Online Users : 79
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/48250

Title: Wear and Corrosion Investigation on the Electrodeposited Ni-P Coating
Authors: H. B. Lee
C.S. Lin
D. S. Wuu
C. Y. Lee
Contributors: 國立臺灣海洋大學:光電與材料科技學系
Keywords: Nickel
Friction Mechanism
Corrosion
Date: 2011-04
Issue Date: 2018-08-20T06:13:16Z
Publisher: Tribology Transactions
Abstract: Abstract: The wear and corrosion characteristics of an electrodeposited Ni-P coating were studied using a block-on-ring wear tester. The testing environments included dry wear and immersion wear in a 5 wt% NaCl water solution bath to simulate the corrosive atmosphere. The wear behavior is discussed in terms of the friction coefficient, wear rate, and surface roughness. Under boundary lubrication, the wear mechanism changed from both adhesive and abrasive wear for dry contact to mostly abrasive wear in corrosive salt water. The corrosion pits and corrosion film formed during accelerated corrosion wear testing not only lowered the friction coefficient but decreased the surface roughness. However, due to the accelerated pitting corrosion and removal of the corrosion film, the weight loss was slightly increased. Finally, the X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM) analyses confirmed the formation of a porous corrosion film after the wear test in salt water.
Relation: 54(4) pp.497-504
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/48250
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat
index.html0KbHTML18View/Open


All items in NTOUR are protected by copyright, with all rights reserved.

 


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback