Loading...
|
Please use this identifier to cite or link to this item:
http://ntour.ntou.edu.tw:8080/ir/handle/987654321/48226
|
| Title: | Temperature effect study of silicon-on-insulator structures prepared by high dose implantation og nitrogen |
| Authors: | Rong-Tan Huang,
P. C. Tsay
W. H. Chen |
| Contributors: | 國立臺灣海洋大學:光電與材料科技學系 |
| Keywords: | Notched Tensile Test
TEM
Ti-15V-3Cr-3Sn-3Al |
| Date: | 2012-02
|
| Issue Date: | 2018-08-16T08:44:11Z
|
| Publisher: | Advanced Materials Research |
| Abstract: | Abstract: Ti-15V-3Cr-3Al-3Sn, β-phase titanium alloy, is subjected to study the temperature effects on microstructure and mechanical behavior by using different aging temperature (426 ∼ 600 oC) and high temperature (450oC) notched tensile test. It follows that the highest hardness of Ti-15V-3Cr-3Al-3Sn would be got up to 420 Hv after 426 oC aging. Afterward, the hardness is decreasing with increasing aging temperature. By means of microstructure analyses, it reveals that the narrow and intragranular α-phase precipitates with lamella-shape in the grains at 426 oC aging treatment caused the age hardening of the titanium alloy. Subsequently, the α-phase precipitates were coarsening with increasing the aging temperature and showed the thick morphologies distributed along grain boundaries, which results in overaging. In the notched tensile test at 450oC, the highest notched tensile strength (1160 MPa) is also obtained after 426oC aging treatment, and then decreasing with increasing aging temperature. Its mechanical behavior is different from the room temperature notched tensile test, which demonstrates the lowest notched tensile strength (813 MPa) after 426 oC aging treatment due to the notched embrittlement effect. According to microstructure study, it suggests that the environment temperature effect enhanced the toughness of the alloy and terminated the notched embrittlement effect resulted from the 426oC aging treatment. |
| Relation: | 217-218 pp.1277-1282 |
| URI: | http://ntour.ntou.edu.tw:8080/ir/handle/987654321/48226 |
| Appears in Collections: | [光電科學研究所] 期刊論文
|
Files in This Item:
| File |
Description |
Size | Format | |
|---|
| index.html | | 0Kb | HTML | 9 | View/Open |
|
All items in NTOUR are protected by copyright, with all rights reserved.
|
