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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/48113

Title: Using autocloning effects to develop broadbandwidth, omnidirectional antireflection structures for silicon solar cells
Authors: C. H. Lin
Y. C. Lee
S. C. Tseng
H. L Chen
C. C. Yu
W. L. Cheng
C. H. Du
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2010-08
Issue Date: 2018-08-13T05:35:08Z
Abstract: Abstract: In this study, we used the autocloning effect on pyramid structures to develop broad-bandwidth, omnidirectional antireflection structures for silicon solar cells. The angular dependence of reflectance on several pyramid structures was systematically investigated. The deposition of three-layer autocloned films reduced the refractive index gap between air and silicon, resulting in an increase in the amount of transmitted light and a decrease in the total light escaping. The average reflectance decreased dramatically to ca. 2–3% at incident angles from 0 to 60° for both sub-wavelength– and micrometer–scale pyramid structures. The measured reflectance of the autocloned structure was less than 4% in the wavelength range from 400 to 1000 nm for incident angles from 0 to 60°. Therefore, the autocloning technique, combined with optical thin films and optical gradient structures, is a practical and compatible method for the fabrication of broad-bandwidth, omnidirectional antireflection structures on silicon solar cells.
Relation: 18(3) pp.421-431
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/48113
Appears in Collections:[光電科學研究所] 期刊論文

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