English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28608/40649
Visitors : 6426706      Online Users : 46
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47508

Title: To explore nano world and material structure stress by x-ray nano probe at Taiwan photon source
Authors: Shao-Chin, Tseng
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2017-07
Issue Date: 2018-07-31T02:22:15Z
Abstract: Abstract: The X-ray nanoprobe (XNP) will open to all professors and researches since 2017. The XNP provides versatile X-ray-based inspection technologies, including diffraction, absorption spectroscopy, imageology, and so on. Also it will improve the analysis scale of imhomogeneous materials, tiny and diluted samples to the nanoscale. Moreover, the high- transmitted XNP can be used to inspect the “Nano World” like atomic arrangements, chemical and electronic configurations, which are widely adopted in the physics, chemistry, materials science, semiconductor devices, nanotechnologies, energy and environmental science, and earth science. Beside to the opening to the researchers, it is also important to improve the inspection and research strength of the XNP in the nanomaterials field, in order to increase the academic influence of the XNP and the Taiwan Photon Source. The primary experimental technique of XNP includes X-ray fluorescence spectroscopy (for the analysis in the depth-of-field distribution of elements), extended X-ray absorption spectroscopy (for the analysis in the electronic configuration and the atomic or molecular bonding length), excitation X-ray fluorescence spectroscopy (for the analysis in the recombination and transport of carriers), in-phase scanning X-ray imageology (the Fourier phase transform calculation can improve the space resolution down to 3nm to 5nm, and detect the stress distribution inside the nanostructures). The design XNP and the experimental applications will be reported.
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47508
Appears in Collections:[光電科學研究所] 演講及研討會

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback