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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47495

Title: Analog-based detection method in optical low-coherence reflectometer for measurement of retardation and fast-axis angle
Authors: C. M. Lai
W. C. Kuo
W. C. Lin
S. C. Lin
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2012-04
Issue Date: 2018-07-26T08:22:13Z
Publisher: Journal of Electromagnetic Waves and Applications
Abstract: Abstract: This study presents a novel detection method in optical low-coherence reflectometer for the simultaneous measurement of the reflectivity and birefringence characteristics of a sample. By implementing analog electronics in a standard two-channel time domain low-coherence reflectometer, the ratio of the envelope amplitude between two orthogonal interferometric signals, which is used for calculating the retardation angle, can then be analog-decoded using a differential detection scheme based on the quotient rule of a logarithmic function. The proposed method for direct retardation measurement benefits from common-mode noise suppression advantages that support efforts to improve the accuracy of phase retardation measurement. Furthermore, a full interferometric signal to extract the phase information is not needed for calculating fast-axis angle. Reductions in data acquisition rates and processing time are expected. The results from a calibrated test plate were correspondingly presented.
Relation: 23(4) pp.523-533
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47495
Appears in Collections:[光電科學研究所] 期刊論文

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