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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47488

Title: Mode Characterization of Sub-Micron Equilateral Triangular Microcavity Including Material's Dispersion Effects
Authors: L. -H. Peng
C.-M. Lai
B. C. Yeh
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2012-05
Issue Date: 2018-07-26T05:52:27Z
Publisher: J. Appl. Phys.
Abstract: Abstract: We report the study of resonant modes in an equilateral triangular gallium nitride (GaN) microcavity, with the material’s dispersion taken into account. From the polarization-resolved photo-luminescence measurements, we observed the resonance of GaN bandedge emission with the cavity modes to be transverse magnetic-polarization active and characterized with a quality factor as high as ∼1000 in a GaN cavity of 0.75 µm side length. Using a finite difference time domain technique, we showed that these observations can be ascribed to the material’s dispersion effects. The latter can modify the cavity phase-matching condition, reduce the spectral bandwidth of the corresponding resonant modes and enhance the cavity quality factor by a factor more than three.
Relation: 111(10)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47488
Appears in Collections:[光電科學研究所] 期刊論文

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