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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47438

Title: Two-Dimensional Refractive Index Profiling by Using Differential Near-Field Scanning Optical Microscopy”
Authors: Pei-Kuen Wei
Wan-Shao Tsai
Way-Seen Wang
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2007-08
Issue Date: 2018-07-23T02:42:06Z
Publisher: App. Phys. Lett.
Abstract: Abstract: The authors present two-dimensional reconstruction of the refractive index profile of an optical waveguide by using differential near-field optical microscopy. Using an inverse algorithm, the refractive index distribution is obtained directly from the measured optical near-field and its derivatives without any assumption of the index profile. The proposed method also takes advantage of subwavelength resolution and low noises in the waveguide region. Two-dimensional index profile reconstruction of a single mode fiber is measured for the demonstration. The measured optical field distribution and refractive index profile agree quite well with the calculated mode and the known index profile.
Relation: 91(6)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47438
Appears in Collections:[光電科學研究所] 期刊論文

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