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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47356

Title: Coherent Microradiology observes a Critical Cathode-Anode Distance Effect in Localized Electrochemical Deposition (LECD)
Authors: G. Margaritondo
S. K. Seol
J. M. Yi
x. Jin
C. C. Kim
J. H. Je
W. L. Tsai
P. C. Hsu
Y. Hwu
C. H. Chen
L. W. Chang
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2004-02
Issue Date: 2018-07-16T08:54:25Z
Publisher: Electrochemical and Solid-State Letters
Abstract: Abstract: Localized electrochemical deposition (LECD) is an emerging technology for inexpensive and effective fabrication of high-aspect-ratio microstructure of diverse materials. Microradiology with coherent X-rays enabled study of this process in real-time. This led to the discovery of a fundamental role of the microelectrode-structure distance: for short distances the deposition rate increases dramatically but the product becomes porous. This role is explained qualitatively with the interplay between metal-ion diffusion and migration in the deposition process. © 2004 The Electrochemical Society. All rights reserved.
Relation: 7(9)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47356
Appears in Collections:[光電科學研究所] 期刊論文

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