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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47333

Title: Hard-X-ray Microscopy with Fresnel Zone Plates Reaches 40 nm Rayleigh Resolution
Authors: C. C. Chien, Y
Yong Chu
J. M. Yi
H. J. Wu
C. L. Wang
Andrei Tkachuk
Wenbing Yun
Michael Feser
S. R. Wu
J. Y. Wang
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2008-03
Issue Date: 2018-07-16T05:50:00Z
Abstract: Abstract: Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8–10keV photons demonstrated a first-order lateral resolution below 40nm based on the Rayleigh criterion. Combined with the use of a phase contrast technique, this makes it possible to view features in the 30nm range; good-quality images can be obtained at video rate, down to 50ms∕frame. The important repercussions on materials science, nanotechnology, and the life sciences are discussed.
Relation: 92(10)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47333
Appears in Collections:[光電科學研究所] 期刊論文

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