English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28605/40643
Visitors : 4492446      Online Users : 43
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47278

Title: SR phase contrast imaging to address the evolution of defects during SiC growth
Authors: Y. Hwu
Mikhail Yu
Tatiana S. Argunova
Gutkin MY
J. H. Je
Evgeniy N
Sergey S. Nagalyuk
Contributors: Tatiana S. Argunova, Mikhail Yu. Gutkin MY, J. H. Je, Evgeniy N. Mokhov, Sergey S. Nagalyuk, Y. Hwu
Date: 2011-04
Issue Date: 2018-07-10T01:25:14Z
Abstract: Abstract: Sliced SiC boule grown by physical vapor transport is investigated using synchrotron white beam phase contrast imaging combined with Bragg diffraction. The evolution of defects is revealed. In the early growth stage, foreign polytype inclusions not only induce massive generation of full‐core dislocations and dislocated micropipes but also attract them, forming slit‐type pores at the boundaries of inclusions.

In the intermediate stage, when inclusions stop to grow and become overgrown by the matrix, the pore density significantly reduces, which is attributed to their transformation into new micropipes. In the later stage, the micropipe density decreases, providing evidence for their partial annihilation and healing. Mechanisms for the evolution from inclusions to pores and finally to micropipes during the crystal growth are further discussed.
Relation: 208(4) pp.819-824
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47278
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback