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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47276

Title: Hard x-ray Zernike microscopy reaches 30 nm resolution
Authors: G. Margaritondo
Yu-Tung Chen
Tsung-Yu Chen
Jaemock Yi
Yong S. Chu
Wah-Keat Lee
Cheng-Liang Wang
lvan M. Kempson
Y. Hwu
Vincent Gajdosik
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2011-04
Issue Date: 2018-07-09T08:53:44Z
Publisher: OPTICS LETTERS
Abstract: Abstract: Since its invention in 1930, Zernike phase contrast has been a pillar in optical microscopy and more recently in x-ray microscopy, in particular for low-absorption-contrast biological specimens. We experimentally demonstrate that hard-x-ray Zernike microscopy now reaches a lateral resolution below 30 nm while strongly enhancing the contrast, thus opening many new research opportunities in biomedicine and materials science.
Relation: 36(7) pp.1269-1271
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47276
Appears in Collections:[光電科學研究所] 期刊論文

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