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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47273

Title: High-resolution hard-X-ray microscopy using second-order zone plate diffraction
Authors: G. Margaritondo
Jaemock Yi
Yong S. Chu
Yu-Tung Chen
Tsung-Yu Chen
Y. Hwu
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2011-06
Issue Date: 2018-07-09T08:22:48Z
Publisher: JOURNAL OF PHYSICS D-APPLIED PHYSICS
Abstract: Abstract: Odd-order diffraction of zone plates (ZPs) is already used for x-ray microscopy but the potential offered by even-order diffraction must still be fully exploited. Width differences between lines and interline spaces transfer intensity from odd-order to even-order diffractions. Here we show that the resulting intense second-order diffraction provides a reasonable tradeoff between spatial resolution and intensity—and constitutes a viable strategy for x-ray microscopy to reach sub-20 nm resolution, in spite of the imperfections of high-aspect-ratio ZPs and of other difficulties.
Relation: 44(23)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47273
Appears in Collections:[光電科學研究所] 期刊論文

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