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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47233

Title: At the frontiers of high-resolution hard-x-ray microscopy: an international programme
Authors: G. Margaritondo
S. R. Wu
C. H. Lin
Y. S. Chen
Y. Y. Chen
Y. Hwu
Y. S. Chu
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2013-12
Issue Date: 2018-07-05T08:32:43Z
Publisher: JOURNAL OF PHYSICS D-APPLIED PHYSICS
Abstract: Abstract: We review the recent progress achieved by our international collaboration on novel imaging
techniques based on high-brightness and highly coherent synchrotron sources. After outlining
the background, we will discuss the technical progress of recent years. Then, we will
exemplify the applications with a number of cases in materials science and life sciences, in
particular neurobiology. New results on metal electrodeposition will be used to practically
illustrate the impact of the techniques in this important technological area and in general its
potential for materials research. Finally, we will briefly comment on the foreseeable technical
improvements and on their positive consequences.
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47233
Appears in Collections:[光電科學研究所] 期刊論文

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