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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47228

Title: Optimization of overlap uniformness for ptychography
Authors: Yong S. Chu
Xiaojing Huang
Hanfei Yan
Ross Harder
Yeukuang Hwu
Ian K. Robinson
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2014-05
Issue Date: 2018-07-05T07:50:22Z
Publisher: OPTICS EXPRESS
Abstract: Abstract: We demonstrate the advantages of imaging with ptychography scans that follow a Fermat spiral trajectory. This scan pattern provides a more uniform coverage and a higher overlap ratio with the same number of scan points over the same area than the presently used mesh and concentric [13] patterns. Under realistically imperfect measurement conditions, numerical simulations show that the quality of the reconstructed image is improved significantly with a Fermat spiral compared with a concentric scan pattern. The result is confirmed by the performance enhancement with experimental data, especially under low-overlap conditions. These results suggest that the Fermat spiral pattern increases the quality of the reconstructed image and tolerance to data with imperfections.
Relation: 22(10) pp.12634-12644
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47228
Appears in Collections:[光電科學研究所] 期刊論文

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