English  |  正體中文  |  简体中文  |  Items with full text/Total items : 26988/38789
Visitors : 2344583      Online Users : 37
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search
LoginUploadHelpAboutAdminister

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47220

Title: Ancient administrative handwritten documents: X-ray analysis and imaging
Authors: G. Margaritondo
F. Albertin
A. Astolfo
M. Stampanoni
E. Peccenini
Y. Hwu
F. Kaplan
Contributors: 國立臺灣海洋大學:光電科學研究所
Keywords: refractive index imaging
X-ray fluorescence
ancient inks
ancient manuscripts
cultural heritage
differential phase contrast
phase contrast
Date: 2015-02
Issue Date: 2018-07-05T06:32:19Z
Publisher: J. Synchrotron Radiat
Abstract: Abstract: Handwritten characters in administrative antique documents from three centuries have been detected using different synchrotron X-ray imaging techniques. Heavy elements in ancient inks, present even for everyday administrative manuscripts as shown by X-ray fluorescence spectra, produce attenuation contrast. In most cases the image quality is good enough for tomography reconstruction in view of future applications to virtual page-by-page `reading'. When attenuation is too low, differential phase contrast imaging can reveal the characters from refractive index effects. The results are potentially important for new information harvesting strategies, for example from the huge Archivio di Stato collection, objective of the Venice Time Machine project.
Relation: 22(2)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47220
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat
index.html0KbHTML31View/Open


All items in NTOUR are protected by copyright, with all rights reserved.

 


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback