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題名: Design and performance of a hard x-ray scanning microscope at the nanoprobe beamline of NSLS-II
作者: Y. Chu
E. Nazaretski
H. Yan
K. Lauer
N. Bouet
X. Huang
W. Xu
J. Zhou
D. Shu
Y. Hwu
貢獻者: 國立臺灣海洋大學:光電科學研究所
關鍵詞: nanoprobes
X-ray microscopy
multilayer Laue lenses
日期: 2017-12
上傳時間: 2018-07-05T01:34:49Z
出版者: J. Synchrotron Radiati
摘要: Abstract: A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.
關聯: 24(6) pp.1113-1119
顯示於類別:[光電科學研究所] 期刊論文


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