English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28588/40619
Visitors : 4116649      Online Users : 55
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47208

Title: Design and performance of a hard x-ray scanning microscope at the nanoprobe beamline of NSLS-II
Authors: Y. Chu
E. Nazaretski
H. Yan
K. Lauer
N. Bouet
X. Huang
W. Xu
J. Zhou
D. Shu
Y. Hwu
Contributors: 國立臺灣海洋大學:光電科學研究所
Keywords: nanoprobes
X-ray microscopy
multilayer Laue lenses
Date: 2017-12
Issue Date: 2018-07-05T01:34:49Z
Publisher: J. Synchrotron Radiati
Abstract: Abstract: A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.
Relation: 24(6) pp.1113-1119
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47208
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback