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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47174

Title: Magnetostriction Measurement of a Ferromagnetic Thin Film Using Digital Holographic Microscope
Authors: S. T. Chen
S. U. Jen
C. C. Liu
Contributors: 國立臺灣海洋大學:光電科學研究所
Date: 2014-11
Issue Date: 2018-07-04T03:24:08Z
Abstract: Abstract: Magnetostrictive Fe62Co19Ga19 films deposited on Si(100) substrates were used as test samples in this paper: the length (L) is parallel to the x-axis and the width (w) parallel to the y-axis. The conventional magnetostriction measurement includes measuring the free end deflection (Δz) of the cantilevered film-substrate system as a function of the external field (H). In addition, we also used a digital holographic microscope (DHM) to map out the 2-D or 3-D magnetostriction deflection profile, i.e., the deflection, Δz, at any location (x, y) on the film plane, due to H∥ (the longitudinal field) or H⊥ (the transverse field). We have compared the saturation magnetostriction (λs) data of the test samples, with different w/L ratios, measured by the conventional as well as the DHM method. There are three advantages of the DHM method. First, we could see the deflection motions directly. Second, we could examine the transverse-edge boundary effect on λs of the test sample. Third, in agreement with the Saint-Venant's principle, we could study the effect of clamping on λs.
Relation: 50(11)
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/47174
Appears in Collections:[光電科學研究所] 期刊論文

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