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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/46164

Title: Design of the Multifunction IC-EMC Test Board with Off-Board Probes for Evaluating a Microcontroller
Authors: Yin-Cheng Chang
Ping-Yi Wang
Shawn S. H. Hsu
Mao-Hsu Yen
Yen-Tang Chang
Chiu-Kuo Chen
Da-Chiang Chang
Contributors: 國立臺灣海洋大學:資訊工程學系
NTOU:Department of Computer Science and Engineering
Keywords: emission;immunity;integrated circuit (IC);electromagnetic compatibility (EMC);microcontroller (MCU)
Date: 2015-05
Issue Date: 2018-05-07T03:53:44Z
Publisher: Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Abstract: Abstract:
A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.
Relation: pp. 223-226
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/46164
Appears in Collections:[資訊工程學系] 演講及研討會

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