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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/41868

Title: Simulation of an Atomic Force Microscopy's Probe Considering Damping Effect
Authors: Chau-Chang Chou;Chieh-Wen Lee;Min-Hsiung Yang
Contributors: 國立臺灣海洋大學:機械與機電工程學系
Date: 2007
Issue Date: 2017-04-07T03:08:28Z
Publisher: COMSOL Conference 2007,
Abstract: Abstract:This paper proposes a numerical model of atomic force microscopy's (AFM) probe using the finite element method (FEM; COMSOL Multiphysics 3.2b) to simulate probe's dynamic behavior under two damping effects: structure damping and squeeze film damping. These damping effects, especially that of squeeze film damping, play an important role in AFM's tapping mode while implemented in atmospheric or aqueous environment. Results are compared with the analytic approach of Yang's previous work [1] and some conclusions, including FEM's numerical disturbance and limitation of resolution, are addressed.

Academic paper (PDF): Simulation of an Atomic Force Microscopy's Probe Considering Damping Effect. Available from: https://www.researchgate.net/publication/266072969_Simulation_of_an_Atomic_Force_Microscopy%27s_Probe_Considering_Damping_Effect [accessed Apr 7, 2017].
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/41868
Appears in Collections:[機械與機電工程學系] 演講及研討會

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