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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/41436

Title: Graphene-edge probes for scanning tunneling microscopy
Authors: Kevin K.W. Chu
Jeng Shiung Chen
Li-Der Chang
Jeff T.H. Tsai
Contributors: 國立臺灣海洋大學:光電科學研究所
Keywords: Scanning tunneling microscope
Field emission
Date: 2017
Issue Date: 2017-02-16T02:35:35Z
Publisher: Optik - International Journal for Light and Electron Optics
Abstract: Abstract: Freestanding graphene-edge probes for scanning tunneling microscopy were demonstrated. Graphene was prepared on a Cu wire by thermal chemical vapor deposition (CVD) from solid carbon sources. Follow by a mechanical cutting process which was controlled by a micromanipulator and an optical microscope. The freestanding graphene probes were then fabricated. Our previous study of electron emission patterns from a field emission microscope demonstrated the layered structure of the graphene edge. We found that a single-layer of graphene emitted electrons comes from a limited number of atoms only when the graphene probe was conditioning carefully to achieve a stable emission current. In this research, we applied such activated graphene probes for use in scanning tunneling microscopes for surface morphology detection. The preconditioned, multi-layer graphene probe presented well resolution that was comparable to conventional Pt-Ir probes. Our study generated a practical method for applying individual freestanding graphene for surface probe microscopy with a cost effective process.
Relation: 130
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/41436
Appears in Collections:[光電科學研究所] 期刊論文

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