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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/38096

Title: Applying Regional Level-Set Formulation to Post-Sawing Four-element LED Wafer Inspection
Authors: Chun-Hsi Li
huan-Yu Chang
MuDer Jeng
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: light emitting diodes
filtering theory
image segmentation
inspection
Date: 2011
Issue Date: 2016-08-03T02:52:25Z
Publisher: IEEE Transactions on Systems, Man, and Cybernetics
Abstract: Abstract: With level-set formulation, new contours can emerge during the evolution of contours. A defect inspection system that utilizes the evolution of zero-level contours for segmenting postsawing wafer is proposed in this study. The system utilizes a regional formulation, which improves the level-set segmentation in images with intensity inhomogeneity. An automatic threshold is used to set the initial contour to a contour near the die region. Fewer iterations are thus required to evolve the zero-level set to segment the wafer. Without the needs for filtering in advance, the inspection can be performed directly on the segmented results. The proposed approach outperforms other postsawing inspection methods in terms of accuracy.
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/38096
Appears in Collections:[電機工程學系] 期刊論文

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