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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/37902

Title: High-Temperature Optical Characterization of Transition Metal Dichalcogenides by Piezoreflectance Measurements
Authors: D. O. Dumcenco;Y. S. Huang;K. K. Tiong;A. Colev;C. Gherman;L. Kulyuk
Contributors: 國立臺灣海洋大學:電機工程學系
Date: 2012-11
Issue Date: 2016-05-23T06:39:46Z
Publisher: Solid State Phenomena
Abstract: Abstract:a systematic optical characterization of transition metal dichalcogenide layered crystals grown by chemical vapour transport method as well as of natural molybdenite were carried out by using piezoreflectance (PzR) measurements. From a detailed lineshape fit of the room-temperature PzR spectra over an energy range from 1.6 to 5.0 eV, the energies of the band-edge excitonic and higher lying interband direct transitions were determined accurately. The possible assignments of the different origins of excitonic transitions are discussed. The near direct band edge A and B excitonic transitions detected in PzR spectra show a linear red-shift with the temperature increasing up to 525 K. The values of temperature-dependent energies of the excitonic transitions A and B are evaluated and discussed.
URI: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/37902
Appears in Collections:[電機工程學系] 期刊論文

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