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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/34787

Title: 使用Z掃描技術量測 (Ba,La)SnO3薄膜之非線性光學特性
The nonlinear optical properties of (Ba,La)SnO3 thin film measured by Z-Scan technique.
Authors: Kun-Wei Zhang
張堃偉
Contributors: NTOU:Institute of Optoelectronic Sciences
國立臺灣海洋大學:光電科學研究所
Keywords: Z掃描;鑭鋇錫氧薄膜
Date: 2013
Issue Date: 2013-10-07T02:46:26Z
Abstract: 本篇文章使用Z掃描技術,量測鈣鈦礦材料鋇錫氧(BaSnO3)參雜鑭 (La),參雜濃度為4.5at%、5.0at%與5.3at%,量測非線性光學特性。Z掃描系統之光源使用鈦-藍寶石雷射,脈衝寬度約為130飛秒,波長為800nm,重覆率為1kHz量測Z掃描開孔徑與閉孔徑結果。 Z掃描閉孔徑量測結果中可知鑭鋇錫氧薄膜樣品呈現自聚焦(self-focusing)現象。鑭鋇錫氧濃度4.5at%薄膜樣品非線性折射率n2=(1.2±0.3) ×10-10 (esu),三階非線性磁化率χ(3)= (3.7±1.1) ×10-19 (m2/V2)。 鑭鋇錫氧濃度5.0at%薄膜樣品非線性折射率n2=(0.9±0.1) ×10-10(esu),三階非線性磁化率χ(3)= (2.9±0.3) ×10-19(m2/V2)。鑭鋇錫氧濃度5.3at%薄膜樣品非線性折射率n2=(1.2±0.2) ×10-10(esu),三階非線性磁化率χ(3)= (3.9±0.5) ×10-19 (m2/V2)。 在Z掃描開孔徑量測中,可知鑭鋇錫氧薄膜樣品呈現飽和吸收。鑭鋇錫氧濃度4.5at%薄膜樣品三光子吸收係數α3=(5.7±0.4)×10-20 (cm3/W2),五階非線性磁化率χ(5)= (2.1±0.1)x10-36(m4/V4)。鑭鋇錫氧濃度5.0at%薄膜樣品三光子吸收係數α3=(5.0±0.2)×10-20(cm3/W2),五階非線性磁化率χ(5)= (1.9±0.1)x10-36 (m4/V4)。鑭鋇錫氧濃度5.3at%薄膜樣品三光子吸收係數α3=(5.0±0.5)×10-20(cm3/W2),五階非線性磁化率χ(5)= (2.2±0.2)x10-36 (m4/V4)。
In this study, we used z-scan technique to measure a thin film of (Ba, La) SnO3 prepared on glass substrate. Its thickness was 200nm, and the (Ba, La) SnO3 thin film was fabricated by BaSnO3 for three different concentrations of Lanthanum such as 4.5at%, 5.0at% and 5.3at% and meant to measure nonlinear optical properties. The light resource of z-scan system applied Ti-sapphire laser while its impulse width was approximately 130 femtoseconds at a wavelength of 800 nm, and its repetition rate was 1 kHz. By results of z-scan close aperture measurements, we could see that (Ba, La) SnO3 thin film remained self-focusing. The experiment results of nonlinear refractive index n2 with different doped concentrations of 4.5at%, 5.0at% and 5.3at% were respectively (1.2±0.3) ×10-10 (esu), (0.9±0.1) ×10-10 (esu) and (1.2±0.2) ×10-10 (esu). The third-order nonlinear susceptibility χ(3) with different concentrations of 4.5at%, 5.0at% and 5.3at% were respectively (3.7±1.1) ×10-19(m2/V2), (2.9±0.3) ×10-19 (m2/V2), and (3.9±0.5) ×10-19 (m2/V2). By results of z-scan open aperture measurements, we could see (Ba, La) SnO3 thin film samples remained saturated absorptions. The experimental results of three-photon absorption coefficient α3 were respectively(5.7±0.4)×10-20 (cm3/W2), (5.0±0.2)×10-20 (cm3/W2) and (5.0±0.5)×10-20 (cm3/W2). The fifth-order nonlinear susceptibilities χ (5) with different concentrations of 4.5at%, 5.0at% and 5.3at% were(2.1±0.1)x10-36(m4/V4), (1.9±0.1)x10-36(m4/V4)and (2.2±0.2)x10-36 (m4/V4)
URI: http://ethesys.lib.ntou.edu.tw/cdrfb3/record/#G0M97880020
http://ntour.ntou.edu.tw/handle/987654321/34787
Appears in Collections:[光電科學研究所] 博碩士論文

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