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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/34165

Title: Annealing-induced changes in the nanoscale electrical homogeneity of bismuth ferrite dielectric thin films
Authors: Yuan-Chang Liang;W.S. Chen;Chia-Yen Hu;Chiem-Lum Huang;W. Kai
Contributors: NTOU:Institute of Materials Engineering
Date: 2011-03
Issue Date: 2013-10-07T02:02:29Z
Publisher: Ceramics International
Relation: 37 (2011) 2391–2396
URI: http://ntour.ntou.edu.tw/handle/987654321/34165
Appears in Collections:[材料工程研究所] 期刊論文

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