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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/33577

Title: Growth and characterization of Iridium Dioxide Nanorods
Authors: R.S. Chen;Y.S. Huang;Y.M. Liang;D.S. Tsai;K.K. Tiong
Contributors: 國立臺灣海洋大學:電機工程學系
Keywords: Iridium dioxide nanorod;Field-emission scanning electron microscopy;Transmission electron microscopy;Raman spectroscopy;X-ray photoelectron spectroscopy
Date: 2004-11-30
Issue Date: 2013-04-11T03:02:53Z
Publisher: Journal of Alloys and Compounds
Abstract: abstract:Conductive iridium dioxide (IrO2) nanorods have been successfully grown on the Si(1 0 0) substrates via metalorganic chemical vapor deposition (MOCVD). A wedge-shaped morphology and naturally formed sharp tips are observed for IrO2 nanorods using field-emission scanning electron microscopy (FESEM). High-resolution transmission electron microscopy (TEM) image and electron diffraction pattern show the growth of IrO2 nanorods preferentially along c-axis. Structure and composition of IrO2 nanorods have also been characterized using the techniques of Raman spectroscopy and X-ray photoelectron spectroscopy (XPS), respectively. It is noted that the IrO2 nanorods are self-mediated instead of the conventional vapor–liquid–solid (VLS) approach or catalyst-mediated method.
Relation: 383(1-2), pp.273–276
URI: http://ntour.ntou.edu.tw/handle/987654321/33577
Appears in Collections:[電機工程學系] 期刊論文

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