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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/28646

Title: Temperature dependence of the edge excitonic transitions of the wurtzite Cd1−x−yBexZnySe crystals
Authors: Y. T. Liu;P. Sitarek;Y. S. Huang;F. Firszt;S. Łęgowski;H. Męczyńska;A. Marasek;W. Paszkowicz;K. K. Tiong
Contributors: NTOU:Department of Electrical Engineering
Keywords: cadmium compounds;beryllium compounds;zinc compounds;II-VI semiconductors;solid solutions;excitons;crystal structure;crystal growth from melt;electroreflectance;photoreflectance;X-ray chemical analysis;spectral line broadening
Date: 2005
Issue Date: 2011-10-21T02:38:48Z
Publisher: Journal of Applied Physics
Abstract: Abstract:We report a detailed investigation of the temperature dependence of the edge excitonic transitions of three Bridgman-grown wurtzite-type Cd1−x−yBexZnySe-mixed crystals using contactless electroreflectance (CER) and photoreflectance (PR) in the temperature range of 15–400 K. X-ray investigations show that the samples with beryllium (Be) content up to x = 0.1 are uniform in composition and exhibit a single wurtzite phase or a wurtzite as the main phase. The transition energies of the A,B, and C excitons of Cd1−x−yBexZnySe are determined via a line-shape fit to the CER and PR spectra. The parameters that describe the temperature dependence of the interband transition energies and the broadening function of the excitonic features are evaluated and discussed.
Relation: 98(8), pp.3519-3525
URI: http://ntour.ntou.edu.tw/handle/987654321/28646
Appears in Collections:[電機工程學系] 期刊論文

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