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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/28496

Title: Growth and characterization of well-aligned rutile TiO2 nanocrystals on sapphire substrates via metal organic vapour deposition
Authors: C. A. Chen;A. Korotcov;Y. S. Huang;W. H. Chung;D. S. Tsai;K. K. Tiong
Contributors: NTOU:Department of Electrical Engineering
國立臺灣海洋大學:電機工程學系
Keywords: Field emission scanning electron microscopy;X-ray diffraction, Raman spectroscopy;MOCVD;rutile TiO2
Date: 2007
Issue Date: 2011-10-21T02:37:47Z
Publisher: Second International Conference on Optical, Optoelectronic and Photonic Materials and Applications 2007
Abstract: Abstract:Well-aligned TiO2 nanocrystals (NCs) were prepared by metalorganic chemical vapour deposition on sapphire (SA) (100) and (012) substrates,using Ti[OCH(CH3)2]4 as precursor. The surface morphology, structural and spectroscopic properties of the deposited NCs were characterized using field emission scanning electron microscopy (FESEM), X-ray diffractometry (XRD) and Raman spectroscopy (RS). FESEM micrographs show that the NCs on SA(100) are vertically aligned. XRD determines the preferable orientations of the as-deposited NCs. RS confirms rutile phase of the NCs. The roles of substrate orientations for the formation of different textures of TiO2 NCs are discussed.
URI: http://ntour.ntou.edu.tw/handle/987654321/28496
Appears in Collections:[電機工程學系] 演講及研討會

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