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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/28386

Title: A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
Authors: Tzong-Dar Wu;Kun-Shan Chen;Jiancheng Shi;Hung-Wei Lee;Fung A.K.
Contributors: NTOU:Department of Electrical Engineering
Keywords: Bistatic scattering;Kirchhoff approximation (KA);geometrical optics model (GOM);integral equation model (IEM);rough surface;small perturbation model (SPM)
Date: 2008
Issue Date: 2011-10-21T02:37:22Z
Publisher: IEEE Transactions on Geoscience and Remote Sensing
Abstract: Abstract:In this paper, we study the bistatic scattering using an advanced integral equation model (AIEM). By keeping all the surface current terms in the Kirchhoff surface fields, the bistatic scattering coefficients are obtained. For simplification, the complete Kirchhoff field did not cast into the derivation of the complementary field. We compare varied updated versions of IEM-based models with the small perturbation model, geometrical optics model, and Kirchhoff approximation standard models at respective regions of validity. The results indicate that the new AIEM provides much more accurate predictions for bistatic scattering.
Relation: 46(9), pp.2584-2598
URI: http://ntour.ntou.edu.tw/handle/987654321/28386
Appears in Collections:[電機工程學系] 期刊論文

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