National Taiwan Ocean University Institutional Repository:Item 987654321/28379
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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/28379

Title: An improved alignment layer grown by oblique evaporation for liquid crystal devices
Authors: Wan-Rone Liou;Chin-Ying Chen;Jyh-Jier Ho;Chao-Kuei Hsu;Chung-Cheng Chang;Robert Y. Hsiao;Shun-Hsyung Chang
Contributors: NTOU:Department of Electrical Engineering
國立臺灣海洋大學:電機工程學系
Keywords: Liquid crystal (LC) molecule;Oblique deposition;Electron beam evaporation;Response time;Contrast ratio
Date: 2006-03
Issue Date: 2011-10-21T02:37:21Z
Publisher: Displays
Abstract: Abstract:In this paper, we present a new approach to aligning liquid crystal (LC) molecules on thin SiO2 films. The SiO2 film is obliquely deposited using electron beam evaporation. The effectiveness of the oblique SiO2 films is determined through measurements of optical and electrical properties. The columnar topography of the SiO2 alignment layer is observed using atomic force microscope (AFM) images. Using an oblique deposition angle of 35°, the deposited SiO2 films reach optimal surface morphology regarding transmittance (92.4%) and roughness (1.643 nm). With this new optimal film, LCD applications show improvements in response time and contrast ratio when compared to LCD applications, which use the typical 90° deposition method. The improvements are about 135 and 40%, respectively.
Relation: 27(2), pp.69-72
URI: http://ntour.ntou.edu.tw/handle/987654321/28379
Appears in Collections:[Department of Electrical Engineering] Periodical Articles

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