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题名: Measurement of fully symmetric four-port device using two-port network analyzer
作者: 陳志榮;瞿大雄;陳宇偉
Chih-Jung Chen;Tah-Hsiung Chu;Yu-Wei Chen
贡献者: NTOU:Department of Communications Navigation and Control Engineering
日期: 2007-06-09
上传时间: 2011-10-21T02:36:57Z
出版者: 2007 IEEE International Symposium on Antennas and Propagation (AP-S 2007)
摘要: Abstract:Fully symmetric four-port devices, such as branch-line hybrid and Riblet short-slot couplers, are no stranger to one with background relevant to microwaves, and cover an immense range of application. Focusing on characterizing fully symmetric four-port devices using a two-port vector network analyzer (VNA), we formulate a new method in this paper. The device under test (DUT), illustrated in Fig. 1, is embedded in two probe pads and two auxiliary terminations for one to perform on-board measurement using two ground-signal-ground (GSG) probes and a two-port VNA. The DUT is a 30 GHz substrate integrated waveguide (SIW) Riblet short-slot hybrid with microstrip-towaveguide transitions [1]-[2], and is fabricated on Rogers RO4003® substrate with 8 mil thickness. By taking advantage of the thru-reflection-line (TRL) calibration technique [3] and the new method, the four-port scattering matrix (S-matrix) of DUT is reconstructed.
關聯: pp.577-580
显示于类别:[通訊與導航工程學系] 演講及研討會


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