English  |  正體中文  |  简体中文  |  Items with full text/Total items : 28611/40649
Visitors : 631426      Online Users : 49
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27743

Title: Temperature Dependence of the Sensitivity of a Long-Range Surface Plasmon Optical Sensor
Authors: C.-W. Chen;C.-H. Lin;H.-P. Chiang;Y.-C. Liu;P. T. Leung;W. S. Tse
Contributors: NTOU:Institute of Optoelectronic Sciences
Date: 2007-11-01
Issue Date: 2011-10-21T02:33:24Z
Publisher: Applied Physics A:Materials Science & Processing
Abstract: abstract:The temperature dependence of the sensitivity of an optical sensor based on long-range surface plasmon resonance (LRSPR) is studied via theoretical modeling. Both the ‘angular interrogation’ and the ‘wavelength interrogation’ modes of operation are studied. In addition, the variation of the full width at half maximum of the LRSPR ‘reflectance dip’ is also studied as a function of temperature, which ultimately determines the temperature dependence of the sensitivity of the sensor when the reflectance is monitored at a fixed incident angle (‘reflectance interrogation’). It is found that while most of the time only the ‘reflectance interrogation’ mode leads to improved sensitivity for the LRSPR sensor compared to a conventional SPR sensor, the temperature stability of the operation of the LRSPR sensor is generally higher than (or at least comparable to) that of the SPR sensor. PACS 73.20.Mf; 07.07.Df
Relation: 89(2), pp.377-380
URI: http://ntour.ntou.edu.tw/handle/987654321/27743
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

File Description SizeFormat

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback