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Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27718

Title: Terahertz Spectroscopic Technique for Characterizing the Microwave dielectric Properties of Ba(Mg1/3Ta2/3)O3 Materials
Authors: T.R Tsai;M.H Liang;C.T Hu;C.C Chi;I.N Lin
Contributors: NTOU:Institute of Optoelectronic Sciences
國立臺灣海洋大學:光電科學研究所
Keywords: Ba(Mg1/3Ta2/3)O3;Dielectric losses;Microwave ceramics;THz spectroscopy
Date: 2001
Issue Date: 2011-10-21T02:33:07Z
Publisher: Journal of the European Ceramic Society
Abstract: Abstract:We have measured the complex index of refraction of Ba(Mg1/3Ta2/3)O3, BMT, ceramics using coherent terahertz (THz) time domain spectroscopy. The dielectric properties of BMT ceramics, which were prepared via a two-step mixed oxide process or a hot isostatic press (HIP) process in 0.1–0.6 THz regime were studied. The real part of the index of refraction of BMT prepared via a two-step process was about 5.04, whereas that of BMT materials prepared via a HIP process was around 4.97. These values are similar to the real part of the index of BMT ceramics in the microwave range (n=5.0). Hipped BMT materials exhibit much larger power loss and hence lower Q-factor than two-step mixed oxide processed BMT in 0.1–0.6 THz regime.
Relation: 21(15), pp.2787-2790
URI: http://ntour.ntou.edu.tw/handle/987654321/27718
Appears in Collections:[光電科學研究所] 期刊論文

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