English  |  正體中文  |  简体中文  |  Items with full text/Total items : 26988/38789
Visitors : 2345281      Online Users : 43
RC Version 4.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Adv. Search

Please use this identifier to cite or link to this item: http://ntour.ntou.edu.tw:8080/ir/handle/987654321/27718

Title: Terahertz Spectroscopic Technique for Characterizing the Microwave dielectric Properties of Ba(Mg1/3Ta2/3)O3 Materials
Authors: T.R Tsai;M.H Liang;C.T Hu;C.C Chi;I.N Lin
Contributors: NTOU:Institute of Optoelectronic Sciences
Keywords: Ba(Mg1/3Ta2/3)O3;Dielectric losses;Microwave ceramics;THz spectroscopy
Date: 2001
Issue Date: 2011-10-21T02:33:07Z
Publisher: Journal of the European Ceramic Society
Abstract: Abstract:We have measured the complex index of refraction of Ba(Mg1/3Ta2/3)O3, BMT, ceramics using coherent terahertz (THz) time domain spectroscopy. The dielectric properties of BMT ceramics, which were prepared via a two-step mixed oxide process or a hot isostatic press (HIP) process in 0.1–0.6 THz regime were studied. The real part of the index of refraction of BMT prepared via a two-step process was about 5.04, whereas that of BMT materials prepared via a HIP process was around 4.97. These values are similar to the real part of the index of BMT ceramics in the microwave range (n=5.0). Hipped BMT materials exhibit much larger power loss and hence lower Q-factor than two-step mixed oxide processed BMT in 0.1–0.6 THz regime.
Relation: 21(15), pp.2787-2790
URI: http://ntour.ntou.edu.tw/handle/987654321/27718
Appears in Collections:[光電科學研究所] 期刊論文

Files in This Item:

There are no files associated with this item.

All items in NTOUR are protected by copyright, with all rights reserved.


著作權政策宣告: 本網站之內容為國立臺灣海洋大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,請合理使用本網站之內容,以尊重著作權人之權益。
網站維護: 海大圖資處 圖書系統組
DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback