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题名: Magnetization Configurations and Magnetization Reversal of Thin Submicron Permalloy Ellipses with Structural Defects
作者: Ching-Ray Chang;Jyh-Shinn Yang
贡献者: NTOU:Institute of Optoelectronic Sciences
关键词: Structural defects;patterned films;magnetization configuration;magnetization reversal;micro magnetic calculations
日期: 2008-06
上传时间: 2011-10-21T02:33:02Z
出版者: Journal of Nanoscience and Nanotechnology
摘要: Abstract:We have studied the magnetic switching behavior of thin elliptical permalloy films with structural defects by micromagnetic simulations. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which alters the local equilibrium magnetization patterns and modifies the switching behavior of magnetization. In particular, for the case of voids close to the edge, the curling effect of voids is significant, and induces the occurrence of the multiple-stage modes of magnetization reversal, resulting in a high switching field.
關聯: 8(6), pp.2901-2904
显示于类别:[光電科學研究所] 期刊論文





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